The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Dec. 09, 2019
Leica Mikrosysteme Gmbh, Vienna, AT;
Peer Oliver Kellermann, Vienna, AT;
LEICA MIKROSYSTEME GMBH, Vienna, AT;
Abstract
A method is proposed for generating a series of sections of a microscopic sample (), in which the sections are detached from the sample () by means of a blade (), collected, and placed onto a transfer device. A sequence in which the sections are detached from the sample is detected; detachment of the sections from the sample () and/or collection of the sections and/or placement of the sections onto the transfer device is monitored by means of one or several observation cameras, accompanied by the acquisition of moving-image data; the sections are tracked in the moving-image data; and positions of the sections on the transfer device are correlated, on the basis of the tracking in the moving-image data, with the sequence in which they were detached from the sample. Also subjects of the present invention are a method for three-dimensional reconstruction of a microscope sample (), in which sections of the sample () are microscopically investigated accompanied by acquisition of section image data and in which the section image data are assembled into a volume image; and a corresponding microtome system () having a microtome () and a data acquisition and evaluation unit (), and having one or several observation cameras ().