The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Mar. 23, 2020
Topcon Corporation, Tokyo, JP;
Satoshi Yasutomi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A trajectory of a measuring device is calculated based on measurement data acquired by the measuring device that is moving along a measurement route, and on a vertical plane orthogonal to the trajectory, a two-dimensional figure is identified by designating an extraction angle range around an intersection of the trajectory and the vertical plane based on a perpendicular drawn down to a horizontal plane from the intersection and an extraction distance range based on the intersection on the vertical plane, and a region obtained by extending the two-dimensional figure along the trajectory is set as an extraction region, and point cloud data in a region including a specific analysis target is extracted as extracted point cloud data from entire circumference point cloud data acquired by scanning the circumference of the measuring device and included in the measurement data.