The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Apr. 27, 2020
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Kai Walter, Schriesheim, DE;
Florian Ziesche, Mannheim, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 2207/10056 (2013.01);
Abstract
An image processing device for improving signal-to-noise of microscopy images includes a memory configured to store microscopy images at least temporarily, and processing circuitry configured to determine an output image based on a weighted rolling average of an ordered set of microscopy images stored in the memory. A method for improving signal-to-noise of microscopy images includes storing microscopy images at least temporarily, and determining an output image based on a weighted rolling average of an ordered set of the stored microscopy images.