The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Apr. 07, 2021
Tekion Corp, San Ramon, CA (US);
Tekion Corp, San Ramon, CA (US);
Abstract
A system and a method are disclosed herein for machine-learned detection of outliers within payload requests. An entity management system uses machine learning to cluster data characterizing requests from entities to route payloads, and determines one or more data clusters that are outliers. The system receives a request to route a payload to a destination, and applies a supervised machine learning model to size and type information indicated by the payload. The supervised machine learning model applies a label to the payload data (e.g., indicating that the payload routing request is an outlier). This outlier detection may drive a validation process to address detected outliers. The system may receive an indication to perform a validation function and transmit the payload to a validation destination. The system may leverage payload data and feedback received from an entity to optimize machine learning techniques to the entity.