The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Dec. 29, 2017
Applicant:

Oath Inc., New York, NY (US);

Inventors:

Francis Hsu, Santa Clara, CA (US);

Mridul Jain, Sunnyvale, CA (US);

Saurabh Tewari, Sunnyvale, CA (US);

Assignee:

VERIZON MEDIA INC., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/02 (2006.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/285 (2019.01); G06N 5/022 (2013.01);
Abstract

The present teaching relates to a method and system for validating labels of training data. A first group of data records associated with the training data are received, wherein each of the first group of data records includes a vector having at least one feature and a first label. For each of the first group of data records, a second label is determined based on the at least one feature in accordance with a first model. Thereafter, a loss based on the first label associated with the data record and the second label is obtained, and the data record having an incorrect first label is classified when the loss meets a pre-determined criterion. Upon classifying the data records, a sub-group of the first group of data records is generated, wherein each of the data records included in the sub-group has the incorrect first label.


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