The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Feb. 12, 2016
Applicant:

National Ict Australia Limited, Eveleigh, AU;

Inventors:

Richard Nock, Eveleigh, AU;

Giorgio Patrini, Eveleigh, AU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/285 (2019.01);
Abstract

This disclosure relates to learning from distributed data. In particular, it relates to determining multiple first training samples from multiple first data samples. Each of the multiple first data samples comprises multiple first feature values and a first label that classifies that first data sample. A processor determines each of the multiple first training samples by selecting a first subset of the multiple first data samples such that the first subset comprises data samples with corresponding one or more of the multiple first feature values, and combining the first feature values of the data samples of the first subset based on the first label of each of the first data samples of the first subset. The resulting training samples can be combined with training samples from other databases that share the same corresponding features and entity matching is unnecessary.


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