The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Jan. 31, 2019
Splunk Inc., San Francisco, CA (US);
Amrittpal Singh Bath, San Francisco, CA (US);
Pratiksha Shah, Fremont, CA (US);
Murugan Kandaswamy, Sunnyvale, CA (US);
Vishal Patel, San Francisco, CA (US);
SPLUNK INC., San Francisco, CA (US);
Abstract
The disclosed technique can be performed by a data intake and query system. The technique includes ingesting data including log data obtained over a network from systems, and receiving user input indicating a scope for retrieving data and a criterion expressed in a structured language. The technique further includes retrieving data based on the scope indicated by the user input and extracting a first field value and a second field value from the retrieved data based on the criterion and the scope. The first field value includes a first numerical value indicative of a measured characteristic of a computing device and the second field value includes a first dimension. The technique further includes storing a first structured metric and the first dimension in a time-series metrics store. The first structured metric includes the first numerical value. The first dimension is associated with the first numerical value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile