The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Jun. 03, 2019
Applicant:

Yokogawa Electric Corporation, Musashino, JP;

Inventors:

Ryouhei Furihata, Tokyo, JP;

Yusuke Yokota, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/273 (2006.01); G06F 11/263 (2006.01); G06F 11/277 (2006.01); G05B 23/02 (2006.01); G01R 31/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2733 (2013.01); G01R 31/00 (2013.01); G01R 31/2894 (2013.01); G05B 23/02 (2013.01); G06F 11/263 (2013.01); G06F 11/277 (2013.01); G01R 31/001 (2013.01); G05B 2219/24065 (2013.01); G05B 2219/31316 (2013.01);
Abstract

A test information management device manages test information relating to a test carried out by receiving a test signal output from a first device in a second device. The test information management device includes a linker configured to link together first information including information representing an output state of the test signal in the first device and second information including image information representing reception results of the test signal in the second device using at least one of identification information for identifying the first device or the second device and times at which the first information and the second information are generated.


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