The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Jul. 23, 2018
Quantum-si Incorporated, Guilford, CT (US);
Jonathan M. Rothberg, Guilford, CT (US);
Gerard Schmid, Guilford, CT (US);
Alexander Gondarenko, Portland, OR (US);
James Beach, Austin, TX (US);
Kyle Preston, Guilford, CT (US);
Farshid Ghasemi, Guilford, CT (US);
Jeremy Lackey, Guilford, CT (US);
Jack Jewell, Boulder, CO (US);
Keith G. Fife, Palo Alto, CA (US);
Ali Kabiri, Madison, CT (US);
Quantum-Si Incorporated, Guilford, CT (US);
Abstract
An integrated device and related instruments and systems for analyzing samples in parallel are described. The integrated device may include sample wells arranged on a surface of where individual sample wells are configured to receive a sample labeled with at least one fluorescent marker configured to emit emission light in response to excitation light. The integrated device may further include photodetectors positioned in a layer of the integrated device, where one or more photodetectors are positioned to receive a photon of emission light emitted from a sample well. The integrated device further includes one or more photonic structures positioned between the sample wells and the photodetectors, where the one or more photonic structures are configured to attenuate the excitation light relative to the emission light such that a signal generated by the one or more photodetectors indicates detection of photons of emission light.