The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Apr. 12, 2021
Applicant:

Scantinel Photonics Gmbh, Ulm, DE;

Inventor:

Vladimir Davydenko, Bad Herrenalb, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/481 (2006.01); G01S 17/32 (2020.01); G02F 1/31 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G01S 7/4816 (2013.01); G01S 17/32 (2013.01); G02F 1/31 (2013.01);
Abstract

A device for scanning measurement of a distance to an object has a light source, which generates an optical output signal having a time-varying frequency. The device includes multiple optical processing units, which are connected optically in parallel to the light source. Each processing unit has an optical distribution matrix including multiple optical switches that distribute optical output signals selectively onto different optical waveguides. Optical output signals are outcoupled into the free space via free space couplers and optical output signals reflected on the object are coupled as optical measurement signals into the waveguides. A detector detects a superposition of the optical measurement signal and the optical output signal generated by the light source. A circulator directs optical output signals supplied by the light source to the distribution matrix and optical measurement signals coming from the distribution matrix to the detector.


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