The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11237224 B1

Date of Patent:

Feb. 01, 2022

Filed:

Oct. 03, 2019

Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same

Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Eunsun Noh, Yongin-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Attorney:

Harness, Dickey & Pierce, P.L.C.

Primary Examiner:

Jarrett J Stark

Int. Cl.

CPC ...

H01L 27/22 (2006.01); G01R 33/032 (2006.01); H01L 43/02 (2006.01); H01L 43/12 (2006.01); H01L 21/66 (2006.01); G01R 15/24 (2006.01); G01R 33/12 (2006.01);

U.S. Cl.

CPC ...

G01R 33/0325 (2013.01); G01R 15/243 (2013.01); G01R 33/032 (2013.01); H01L 22/14 (2013.01); H01L 27/22 (2013.01); H01L 43/02 (2013.01); H01L 43/12 (2013.01); G01R 33/12 (2013.01);

Abstract

A magnetic property measuring system may include a stage configured to load a sample and to rotate the sample about a rotation axis such that the stage rotates the sample by a rotation angle, the rotation axis extending normal to a top surface of the sample. The magnetic property measuring system may further include a polarizer having a first polarization axis, and an analyzer having a second polarization axis. The polarizer and the analyzer may enable the first and second polarization axes to be independently rotated based on the rotation angle of the sample.

Find Patent Forward Citations

Noh, Eunsun. (2022). Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same (U.S. Patent No. 11237224). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11237224

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