The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Sep. 13, 2019
Applicant:

Anritsu Company, Morgan Hill, CA (US);

Inventor:

Jon Martens, San Jose, CA (US);

Assignee:

ANRITSU COMPANY, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
G01R 27/28 (2013.01);
Abstract

A system and method for making improved measurements of integrated antenna arrays utilizes vector network analyzer (VNA) and a calibrated receive-side system comprising two antennae, dual reflectometers coupled to the two antennae for match correction, a wide band intermediate frequency (IF) strip which connects the receive-side system to the input ports of the VNA, an air gap which separates the receive-side system form the DUT, and a stepmotion baffle configure to be inserted into the air gap to modify antenna coupling. The system and method enable measurement of noise characteristics of the DUT including nonlinear effects of transmitter element coupling between the plurality of transmitter elements within an antenna array.


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