The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Sep. 04, 2019
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Universite Paris-sud 11, Orsay, FR;

Inventor:

Alexandre Dazzi, Orsay, FR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/34 (2010.01); G01N 21/39 (2006.01); G01Q 60/36 (2010.01); G01Q 30/02 (2010.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01Q 30/02 (2013.01); G01Q 60/34 (2013.01); G01Q 60/363 (2013.01); G01N 2201/0697 (2013.01);
Abstract

A system for measuring the absorption of a laser radiation by a sample is provided. The system comprises: •(i) a pulsed laser source, suitable for emitting pulses at a repetition frequency fand arranged so as to illuminate the sample; •(ii) an AFM probe arranged so as to be able to be placed in contact with the region of the surface of the sample on one side, the AFM probe having a mechanical resonance mode at a frequency f; and •(iii) a detector configured to measure the amplitude of the oscillations of the AFM probe resulting from the absorption of the laser radiation by the region of the surface of the sample, characterized in that it also comprises a translation system designed to displace the sample at a frequency f.


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