The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Aug. 28, 2018
Applicant:

Mls Acq, Inc., East Windsor, CT (US);

Inventors:

Eddie Dean Wyatt, Havertown, PA (US);

Martin L. Spartz, Ellington, CT (US);

Assignee:

MLS ACQ, Inc., East Windso, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01N 30/02 (2006.01); G01N 30/86 (2006.01); G01N 33/00 (2006.01); G01N 21/35 (2014.01); G01N 30/04 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01N 30/02 (2013.01); G01N 30/8668 (2013.01); G01N 30/8672 (2013.01); G01N 30/7206 (2013.01); G01N 33/0047 (2013.01); G01N 2021/3595 (2013.01); G01N 2030/025 (2013.01); G01N 2030/042 (2013.01);
Abstract

A process for identifying an unknown compound in a sample includes matching a peak in a primary Fourier Transform Infrared spectral region of the sample spectrum with reference spectra in the same spectral region to generate an initial list of potential candidates, based, for example on goodness of fit criteria. The initial list can be reduced by retention time information and/or global peak matching techniques that analyze the sample spectrum in regions outside the primary region.


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