The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Mar. 16, 2020
Applicant:
Olympus Corporation, Tokyo, JP;
Inventors:
Kentaro Imoto, Tokyo, JP;
Makoto Ishikake, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01T 1/24 (2006.01); G01J 1/04 (2006.01); G01N 21/27 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01J 1/04 (2013.01); G01N 21/27 (2013.01); G01T 1/24 (2013.01); G01T 1/2964 (2013.01); G01J 2001/442 (2013.01); G01J 2001/4466 (2013.01);
Abstract
An optical measurement device includes: an optical sensor that detects pulsed signal light and that outputs a detection signal formed of an exponential-function response; an A/D converter that samples the detection signal output from the optical sensor and that converts the detection signal into a digital signal; and a processor comprising hardware, the processor being configured to subject the digital signal output from the A/D converter to inverse transformation by using a multiple diagonal matrix, thus calculating an estimated pulse of the signal light.