The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Sep. 14, 2020
Applicant:

Yazaki Corporation, Tokyo, JP;

Inventor:

Tatsuo Osada, Makinohara, JP;

Assignee:

Yazaki Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01N 21/952 (2006.01); H01R 43/048 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01N 21/952 (2013.01); H01R 43/048 (2013.01);
Abstract

The appearance inspection device inspects an appearance of a crimp terminal by capturing an image of the crimp terminal with a camera while applying illumination light onto the crimp terminal. The device includes an illumination unit for applying illumination light onto a crimp terminal and cameras that capture an image of the crimp terminal. A planar gradation light source having brightness that gradually changes in a predetermined direction from one side on an illumination surface toward another side is provided as the illumination unit. The cameras are disposed such that the gradation light source is reflected on an image obtained by the camera capturing the image of the crimp terminal, as a reflected image on a surface of the crimp terminal.


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