The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Jul. 21, 2020
Applicants:

Yusuke Ishizaki, Kanagawa, JP;

Takaaki Kaneko, Kanagawa, JP;

Inventors:

Yusuke Ishizaki, Kanagawa, JP;

Takaaki Kaneko, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); G01B 11/06 (2006.01); B41J 11/00 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 11/0095 (2013.01); G01B 11/0608 (2013.01); B41J 2203/011 (2020.08);
Abstract

An abnormality detecting device includes: a light emitter including a light-emitting element disposed at one side of a conveyed medium, and configured to emit a laser beam having a width in a thickness direction of the medium by the light-emitting element; a light receiver disposed at the other side of the medium to be opposed to the light emitter across the medium, including a plurality of light-receiving elements arranged in the thickness direction of the medium, and configured to receive, by the plurality of light-receiving elements, the laser beam emitted by the light emitter; and a detecting unit configured to detect a lift of the medium in a case where a number of light-receiving elements indicating received light amounts not exceeding a first threshold and being arranged successively in the thickness direction among the plurality of light-receiving elements exceeds a second threshold.


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