The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Sep. 13, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Takashi Izumi, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/046 (2014.01); B23K 26/70 (2014.01); B23K 26/06 (2014.01);
U.S. Cl.
CPC ...
B23K 26/046 (2013.01); B23K 26/0648 (2013.01); B23K 26/705 (2015.10); B23K 26/707 (2015.10);
Abstract

A laser machining device includes a first focus movement amount calculation section configured to calculate a focus movement amount based on comparison of a first measurement value obtained by averaging a plurality of measurement values measured by a returning light measurement unit within a first period and a second measurement value obtained by averaging a plurality of measurement values measured by the returning light measurement unit within a second period that is temporally later than the first period; and a focus position correction section configured to correct a focus position during laser machining based on the focus movement amount, and the first period is a period shortly after initiation of laser emission when the external optical system is not warmed up or is a period after correcting the focus position, and the second period is a period after passage of a certain time duration when the external optical system is warmed up.


Find Patent Forward Citations

Izumi, Takashi. (2022). Laser machining device for adjusting focus shift based on contamination level of optical system during laser machining (U.S. Patent No. 11235419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11235419

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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