The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2022

Filed:

Nov. 07, 2016
Applicant:

Clecim S.a.s., Savigneux, FR;

Inventors:

Bastien Bouby, Saint Etienne, FR;

Dominique Tellier, Saint Etienne, FR;

Florian Turchet, Saint Chamond, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B21B 38/02 (2006.01); G01B 5/28 (2006.01); G01B 21/30 (2006.01);
U.S. Cl.
CPC ...
B21B 38/02 (2013.01); G01B 5/285 (2013.01); G01B 21/30 (2013.01); B21B 2263/04 (2013.01);
Abstract

A method and a device that performs the method for measuring the flatness of a metal product traveling on a path, the method includes measuring a first longitudinal tension measurement value (T) with a measuring roller, determining a model of stress over the thickness of the metal product as a function of plastic or elastoplastic deformation of the product, calculating a correction factor for the longitudinal deformation according to the stress model, calculating a corrective value (T', T′) for the first longitudinal tension measurement value (T) at at least one evaluation point (M, M) as a function of the longitudinal deformation correction factor (Z), and calculating a corrected flatness measurement value (PC) at at least one of the evaluation points.


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