The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Oct. 18, 2018
Intai Technology Corp., Taichung, TW;
INTAI TECHNOLOGY CORP., Taichung, TW;
Abstract
A dynamic reference deviation detecting method is used for detecting a deviation of a dynamic reference coordinate system. A coordinate detecting step is for detecting and recording a first initial coordinate and a second initial coordinate. A first coordinate variation calculating step is for calculating a difference between a first instantaneous coordinate and the first initial coordinate to obtain a first difference value. A second coordinate variation calculating step is for calculating a difference between a second instantaneous coordinate and the second initial coordinate to obtain a second difference value. A relative coordinate variation calculating step is for obtaining a relative difference value. A dynamic reference deviation determining step is for determining whether or not the dynamic reference coordinate system is deviated according to the first difference value, the second difference value and the relative difference value.