The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Dec. 05, 2019
Applicant:

Zte Corporation, Guangdong, CN;

Inventors:

Hanging Xu, Guangdong, CN;

Yajun Zhao, Guangdong, CN;

Xincai Li, Guangdong, CN;

Ling Yang, Guangdong, CN;

Assignee:

ZTE CORPORATION, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01); H04W 76/27 (2018.01); H04W 24/10 (2009.01); H04W 72/04 (2009.01); H04W 80/02 (2009.01);
U.S. Cl.
CPC ...
H04L 5/0073 (2013.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01); H04W 24/10 (2013.01); H04W 72/042 (2013.01); H04W 72/0446 (2013.01); H04W 76/27 (2018.02); H04W 80/02 (2013.01);
Abstract

A method and system for measuring and controlling cross-link interference (CLI) between two devices in a wireless communication network is disclosed herein. In one embodiment, a method implemented on a first node for mitigating CLI between the first node and a second node is disclosed. The method comprises: receiving a wireless signal from the second node; measuring the wireless signal to determine a measurement value according to a predetermined metric for measuring CLI; determining an event based on the measurement value; and mitigating the CLI in accordance with a predetermined mitigation scheme associated with the event.


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