The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Oct. 21, 2019
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Soeng-Hun Kim, Gyeonggi-do, KR;

Gert-Jan Van Lieshout, Middlesex, GB;

Kyeong-In Jeong, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04W 24/10 (2009.01); H04W 36/04 (2009.01); H04W 72/04 (2009.01); H04B 7/022 (2017.01);
U.S. Cl.
CPC ...
H04L 5/0053 (2013.01); H04L 5/001 (2013.01); H04L 5/0098 (2013.01); H04W 24/10 (2013.01); H04W 36/04 (2013.01); H04W 72/0453 (2013.01); H04B 7/022 (2013.01); H04L 5/0057 (2013.01); H04L 5/0091 (2013.01);
Abstract

The present disclosure relates to a pre-5-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4-Generation (4G) communication system such as long term evolution (LTE). A method for performing a measurement procedure by a user equipment (UE) in a wireless communication system supporting a dual connectivity (DC) is provided. The method includes receiving control information including measurement gap configuration information indicating gap configuration for at least one operating frequency band to which a measurement gap is applied; obtaining a system frame number (SFN) of a serving cell and a sub-frame of the serving cell based on the measurement gap configuration information; determining a first sub-frame of the measurement gap based on the SFN and the sub-frame; and performing a measurement on at least one serving cell including the serving cell at the first sub-frame.


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