The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Sep. 20, 2019
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Glennis Eliagh Covington, Austin, TX (US);

Benjamin Lyle Winston, Austin, TX (US);

Santha Kumar Parameswaran, Austin, TX (US);

Shannon T. Kesner, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/38 (2006.01); G11C 11/4093 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 11/4093 (2013.01);
Abstract

Methods, devices, and systems for testing a number of combinations of memory in a computer system. A modular memory device is installed in a memory channel in communication with a processor. The modular memory device includes a number of memory storage devices. The number of memory storage devices include a number of pins. A subset of the number of memory storage devices is selected. A subset of the plurality of pins which do not correspond to the subset of the number of memory storage devices and are not part of a memory map of the computer system is selected. Each pin of the subset of the plurality of pins configured with a termination impedance. The subset of the number of memory storage devices is tested.


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