The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Mar. 31, 2015
Koninklijke Philips N.v., Eindhoven, NL;
Marinus Bastiaan Van Leeuwen, Eindhoven, NL;
Jelte Peter Vink, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to an examining device () for processing and analyzing an image of a bio sample, an examining method for processing and analyzing an image of a bio sample, a computer program element for controlling such device (), and a corresponding computer readable medium. The examining device () for processing and analyzing an image of a bio sample comprises an interface unit, an image analyzing unit, and a display unit. The interface unit is configured to provide an image of a bio sample. The image analyzing unit is configured to indicate a region of interest in the image as reference region, to extract a characteristic of the reference region from the image and to analyze the image for alternative regions with a similar characteristic. The display unit is configured to display the result of the analysis for alternative regions with a similar characteristic.