The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Feb. 28, 2017
Nec Corporation, Tokyo, JP;
Takami Sato, Tokyo, JP;
Kota Iwamoto, Tokyo, JP;
Yoshinori Saida, Tokyo, JP;
Shin Norieda, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Provided is an inspection assistance device which includes: a first acquisition unit that acquires first data which is image data used to acquire results of inspection on a to-be-inspected object; a second acquisition unit that acquires second data that is different in type from the first data and is used to acquire results of inspection on the to-be-inspected object; and a display control unit that causes a display unit to display a result of comparison between first inspection result information pertaining to the inspection results based on the acquired first data and second inspection result information pertaining to the inspection results based on the acquired second data in such a manner as to be superimposed on an image in which the inspected object is displayed.