The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Dec. 27, 2019
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventors:

Badrinath Padmanabhan, San Jose, CA (US);

Yiyi Ren, San Jose, CA (US);

Wenshou Chen, Santa Clara, CA (US);

Richard Mann, Santa Clara, CA (US);

Alireza Bonakdar, San Jose, CA (US);

Assignee:

OMNIVISION TECHNOLOGIES, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06N 20/00 (2019.01); G06K 9/62 (2006.01); G06F 21/32 (2013.01);
U.S. Cl.
CPC ...
G06K 9/00268 (2013.01); G06F 21/32 (2013.01); G06K 9/00234 (2013.01); G06K 9/00248 (2013.01); G06K 9/6256 (2013.01); G06N 20/00 (2019.01);
Abstract

A system comprising a polarization CMOS image sensor, at least one processor and a non-transitory computer-readable medium having computer-executable instructions stored thereon that, in response to execution by the at least one processor, cause the system to perform actions including receiving, from the polarization CMOS image sensor, polarization information and two-dimensional image information. The polarization information is processed using a machine learning model to generate an output that indicates whether the polarization information represents a valid biometric measurement of a physical feature of a subject.


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