The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Jan. 30, 2020
Applicant:

Splunk, Inc., San Francisco, CA (US);

Inventors:

Ujwala Khante, San Jose, CA (US);

Daniel See, Livermore, CA (US);

Nicholas Tankersley, Seattle, WA (US);

Po Hsin Wang, San Francisco, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/25 (2019.01); G06F 16/245 (2019.01);
U.S. Cl.
CPC ...
G06F 16/258 (2019.01); G06F 16/245 (2019.01);
Abstract

In accordance with various embodiments of the present disclosure, a query for information related to machine data generated by one or more machine data sources of a cloud computing platform (CCP) is sent by a client computing device and to a cloud computing monitoring component of the CCP, where the query is formed using native query language of the CCP. As a result, the client computing device via a connector receives a first data object that is formatted in accordance with a first format associated with the CCP. The client computing device via the connector may then convert the first data object to one or more second data objects formatted in accordance with a second format that allows for enhanced ingestion by a data intake and query system.


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