The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Feb. 28, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Khai Tran, San Mateo, CA (US);

Harsh Shah, Sunnyvale, CA (US);

Maneesh Varshney, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/2455 (2019.01); G06F 16/242 (2019.01); G06F 16/2453 (2019.01); G06F 16/2452 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24553 (2019.01); G06F 16/2433 (2019.01); G06F 16/24524 (2019.01); G06F 16/24544 (2019.01); G06F 16/24568 (2019.01);
Abstract

A unified metrics computation platform decouples user-facing query languages from backend execution engines with the help of an intermediate platform-agnostic language, based on relational algebra procedural query language. The user needs to only specify the computation logic at a single place. By leveraging the intermediate language representation, the unified metrics computation platform can execute the same computation logic on multiple execution engines. The unified metrics computation platform unifies batch, nearline and interactive computations by automatically converting existing user defined batch logic into nearline logic. The user is presented with a unified view of the batch and nearline computation results.


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