The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
May. 02, 2019
Servicenow, Inc., Santa Clara, CA (US);
Matthew Robert Coleman, San Francisco, CA (US);
Lauren Karina Choi, San Francisco, CA (US);
Anson Barber Mayers, San Rafael, CA (US);
Joel Rorik Fischer, San Francisco, CA (US);
ServiceNow, Inc., Santa Clara, CA (US);
Abstract
A system includes software and a computing device configured to test the software in parallel. The computing device may obtain a first test case from a plurality of test cases. The first test case may be configured to cause the software to access a subset of data entries in a database. A plurality of locks facilitates exclusive access to the plurality of data entries. The computing device may further attempt to acquire a subset of the locks that correspond to the subset of the data entries. The computing device may further determine when to execute the first test case. Doing so involves either: (i) failing to acquire all of the subset of the locks and delaying execution of the first test case, or (ii) successfully acquiring all of the subset of the locks and executing the first test case in parallel with the second test case.