The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Jun. 13, 2019
International Business Machines Corporation, Armonk, NY (US);
Andrew Hicks, Wappingers Falls, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Steven M. Partlow, Beacon, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Systems, methods, and computer-readable media are described for utilizing breakpoint value-based fingerprints of failing regression test cases to determine specific components of a System Under Test (SUT) that are causing a fault such as specific lines of source code. A failing test case from a regression run is selected and fault localization and inverse combinatorics techniques are employed to generate a set of failing test cases around the selected failing test case. A set of test fingerprints corresponding to the set of failing test cases is compared to a set of test fingerprints corresponding to a set of passing test cases to determine breakpoints that are indicated as being encountered during execution of at least one failing test case and that are not encountered during execution of any of the passing test cases. Specific lines of source code that correspond to these breakpoints are then identified as causing the fault.