The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Jul. 20, 2016
Applicant:

Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);

Inventors:

Matthew Jacob Halladay, Moscow, ID (US);

Ellery Abner Blood, Moscow, ID (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2020.01); G06F 11/14 (2006.01); H03K 5/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1441 (2013.01); H03K 5/26 (2013.01);
Abstract

The present disclosure pertains to detection of anomalous conditions in a variety of types of systems. In one embodiment, a system may be configured to identify anomalous conditions in a stream of measurements. The system may include a communications interface configured to receive a stream of measurements. An archive subsystem may maintain a data archive comprising a statistical representation of the stream of measurements. A pre-processing subsystem may divide the stream of measurements into a plurality of data windows. The plurality of data windows may be analyzed by an analysis subsystem configured to generate a plurality of normalized representations based on the data archive. The plurality of normalized representations may be grouped into a plurality of ranges. An anomaly detection subsystem may perform a comparison of the plurality of normalized representations to at least one threshold and may determine that the comparison indicates an anomalous condition.


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