The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Aug. 14, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Chi Zhang, San Jose, CA (US);

Ahmed Khairy Farahat, Santa Clara, CA (US);

Chetan Gupta, San Mateo, CA (US);

Karan Aggarwal, Minneapolis, MN (US);

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); G05B 23/0254 (2013.01); G06N 3/084 (2013.01);
Abstract

Example implementations described herein involve, for data having incomplete labeling to generate a plurality of predictive maintenance models, processing the data through a multi-task learning (MTL) architecture including generic layers and task specific layers for the plurality of predictive maintenance models configured to conduct tasks to determine outcomes for one or more components associated with the data, each task specific layer corresponding to one of the plurality of predictive maintenance models; the generic layers configured to provide, to the task specific layers, associated data to construct each of the plurality of predictive maintenance models; and executing the predictive maintenance models on subsequently recorded data.


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Zhang, Chi. (2022). Multi task learning with incomplete labels for predictive maintenance (U.S. Patent No. 11231703). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11231703

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