The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Nov. 26, 2019
Toppan Printing Co., Ltd., Tokyo, JP;
Tomohito Masuda, Tokyo, JP;
Eri Miyamoto, Tokyo, JP;
TOPPAN PRINTING CO., LTD., Tokyo, JP;
Abstract
An identification apparatus or system includes an estimation unit that estimates an operating distance between the surface of an optical device and an imaging unit as an estimated value. A reference distance refers to the distance between a first face of an identification target and the imaging unit and at which light diffracted by a diffraction grating is capable of being recorded by the imaging unit. A first determination unit is included that determines whether the estimated value matches the reference distance and a second determination unit that determines whether an image captured by the imaging unit matches a reference image. Conditions for identifying the optical device as the identification target include a condition that the first determination unit determines that the estimated value matches the reference distance and a condition that the second determination unit determines that the image captured by the imaging unit matches the reference image.