The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Apr. 20, 2020
Applicant:

Regents of the University of Minnesota, Minneapolis, MN (US);

Inventors:

Steen Moeller, Minneapolis, MN (US);

Mehmet Akcakaya, Minneapolis, MN (US);

Seng-Wei Chieh, Minneapolis, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01); G01R 33/58 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/4824 (2013.01); G01R 33/561 (2013.01); G01R 33/56545 (2013.01); G01R 33/583 (2013.01);
Abstract

A fully sampled calibration data set, which may be Cartesian k-space data, is used to obtain targeted and optimal interpolation kernels for non-regularly sampled data. The calibration data are self-calibration data obtained from a time-averaged image, or re-sampled data. ACS data are resampled for calibration of region-specific kernels. Subsequently, an explicit noise-based regularized solution can be utilized to estimate region-specific kernels for reconstruction.


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