The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

May. 15, 2020
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Steffen Neidhardt, Munich, DE;

Josef Schmoeller, Munich, DE;

Corbett Rowell, Munich, DE;

Daniel Markert, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/302 (2006.01); H01Q 19/10 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3025 (2013.01); H01Q 19/10 (2013.01);
Abstract

The present disclosure relates to a system for aligning a measurement system suitable for radio frequency measurement of a device under test. The system includes an alignment device, a measurement module and an indication module. The alignment device includes at least two alignment antennas configured to receive a signal over-the-air from a measurement antenna of the measurement system. The measurement module is configured to measure a phase difference between the at least two alignment antennas receiving the signal. The indication module is configured to indicate the measured phase difference between the at least two alignment antennas or a reference quantity associated with the measured phase difference. Further, a method of aligning a measurement system used for radio frequency measurement of a device under test is described.


Find Patent Forward Citations

Loading…