The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Nov. 22, 2019
Applicant:

Temptronic Corporation, Mansfield, MA (US);

Inventors:

Norbert Elsdoerfer, Warwick, RI (US);

Chuan Weng, Cummings, GA (US);

Assignee:

TEMPTRONIC CORPORATION, Mansfield, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2877 (2013.01); G01R 31/2875 (2013.01);
Abstract

A temperature control system includes a fluid chiller, an air dryer, and a plurality of test stations positioned at remote locations from the fluid chiller and the air dryer. The fluid chiller is configured to generate a chilled fluid stream. The air dryer is configured to generate a dry air stream. Each local test station includes a heat exchanger and thermal control unit. The heat exchanger is configured to selectively cool the dry air stream with the chilled fluid stream to generate an output stream. The thermal control unit is configured to control distribution of the output stream to a local test site.


Find Patent Forward Citations

Elsdoerfer, Norbert. (2022). System and method for controlling temperature at test sites (U.S. Patent No. 11231455). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11231455

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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