The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Feb. 16, 2018
Sony Corporation, Tokyo, JP;
Sony Semiconductor Solutions Corporation, Kanagawa, JP;
Isamu Nakao, Kanagawa, JP;
Noriyuki Kishii, Kanagawa, JP;
Tetsuro Kuwayama, Tokyo, JP;
Kensei Jo, Tokyo, JP;
SONY CORPORATION, Tokyo, JP;
SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa, JP;
Abstract
The flow rate of light scattering fluid is measured more easily and at a higher speed. A flow rate measuring method according to the present disclosure includes: generating two or more speckle images by continually imaging light scattering fluid to be measured, while defining time shorter than spatial correlation disappearance time corresponding to time in which spatial correlation between speckle patterns generated by the light scattering fluid disappears as exposure time, at a time interval shorter than the spatial correlation disappearance time; and calculating direction and speed of flow of the light scattering fluid from time variation of the speckle patterns between the two or more speckle images, in which the speckle images are imaged by using an imaging device mounted with an area sensor and a pixel group of a part of the area sensor or by using an imaging device mounted with a line sensor.