The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Sep. 21, 2018
Koninklijke Philips N.v., Eindhoven, NL;
Andriy Yaroshenko, Garching, DE;
Thomas Koehler, Norderstedt, DE;
Peter Benjamin Theodor Nöel, Unterfohring, DE;
Fabio De Marco, Hamburg, DE;
Lukas Benedict Gromann, Freising, DE;
Konstantin Willer, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector () is arranged opposite an X-ray source () across an examination region () with a grating arrangement () arranged between the X-ray source () and the X-ray detector (). During an imaging operation without an object in the examination region () the grating arrangement () is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector () whilst the X-ray detector () remains stationary relative to the examination region () such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device ('″) with less scanning motions.