The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Nov. 28, 2018
Sysmex Corporation, Kobe, JP;
Tomoyuki Nose, Kobe, JP;
Yusuke Muda, Kobe, JP;
Kanako Nagaoka, Kobe, JP;
Noriyuki Narisada, Kobe, JP;
Varun Nambigari, Kobe, JP;
SYSMEX CORPORATION, Kobe, JP;
Abstract
A method according to one or more aspects may be a method of measuring a detection material contained in a sample by using a cartridge including: chambers each capable of housing at least one of the detection material and a reagent; and a path through which the detection material is transferred between the chambers. The method may include: moving at least one of the chambers and the path to a measurement position and an image capturing range by rotating the cartridge about a rotational shaft; measuring the detection material in the measurement position; and capturing an image of a monitoring target comprising at least one of the chambers and the path in the image capturing range.