The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Jun. 12, 2020
Applicants:

Andreas Mandelis, Scarborough, CA;

Koneswaran S. Sivagurunathan, Scarborough, CA;

Pantea Tavakolian, Etobicoke, CA;

Inventors:

Andreas Mandelis, Scarborough, CA;

Koneswaran S. Sivagurunathan, Scarborough, CA;

Pantea Tavakolian, Etobicoke, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/01 (2006.01); G01N 21/17 (2006.01); G06T 11/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/171 (2013.01); A61B 5/0093 (2013.01); A61B 5/015 (2013.01); A61B 5/4312 (2013.01); G06T 11/003 (2013.01); A61B 2576/00 (2013.01); G01N 2021/1714 (2013.01);
Abstract

Systems and methods are provided for performing thermophotonic imaging using cross-correlation and subsequent time-gated truncation. Photothermal radiation is detected with an infrared camera while exciting a sample with a chirped set of incident optical pulses and time-dependent photothermal signal data is processed using a method that involves performing cross-correlation and subsequent time-gated truncation. The post-cross-correlation truncation method results in depth-resolved images with axial and lateral resolution beyond the well-known thermal-diffusion-length-limited, depth-integrated nature of conventional imaging modalities. An axially resolved photothermal image sequence can be obtained, capable of reconstructing three-dimensional visualizations of photothermal features in wide classes of materials.


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