The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Mar. 14, 2019
Applicant:
Aecom, Los Angeles, CA (US);
Inventors:
Daniel Avery Buckley, Long Beach, CA (US);
Brad William Koons, North Oaks, MN (US);
Steven Thomas Gaito, South Easton, MA (US);
Monal Gajjar, Cerritos, CA (US);
Assignee:
AECOM, Los Angeles, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 19/08 (2006.01); G01N 33/28 (2006.01);
U.S. Cl.
CPC ...
G01L 19/08 (2013.01); G01N 33/28 (2013.01);
Abstract
Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL. The pressure transducer assembly can be configured to measure a first pressure associated with the pressure exerted by the first layer.