The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Jul. 22, 2020
Applicant:

Brunson Instrument Company, Kansas City, MO (US);

Inventor:

Mark J. Meuret, Overland Park, KS (US);

Assignee:

BRUNSON INSTRUMENT COMPANY, Kansas City, MO (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/00 (2006.01); G01B 21/04 (2006.01); G01B 11/00 (2006.01); G01B 5/008 (2006.01);
U.S. Cl.
CPC ...
G01B 21/042 (2013.01); G01B 5/0004 (2013.01); G01B 5/008 (2013.01); G01B 11/005 (2013.01);
Abstract

A system and method of calibrating a measuring instrument is provided. The system includes a support system for quickly and easily securing a low thermal expansion length reference bar in position. The reference bar is coupled to the support beam using a kinematic mounting system that is designed to reduce or eliminate errors associated with over-constraining the reference bar. The system is optimized for field calibration of certain measuring instruments, such as measuring instruments having articulating arms. Opposed first and second ends of the reference bar include respective first and second retroflectors and/or first and second probe receivers at known distances relative to each other, thereby facilitating calibration of the measuring instrument.


Find Patent Forward Citations

Loading…