The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Dec. 14, 2012
Applicant:

Dsm Ip Assets B.v., Heerlen, NL;

Assignee:

DSM IP ASSETS B.V., Heerlen, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D01F 6/04 (2006.01); D02G 3/02 (2006.01); D07B 1/02 (2006.01); D01D 5/06 (2006.01);
U.S. Cl.
CPC ...
D01F 6/04 (2013.01); D02G 3/02 (2013.01); D01D 5/06 (2013.01); D07B 1/025 (2013.01); D07B 2201/1096 (2013.01); D07B 2201/2009 (2013.01); D07B 2205/2014 (2013.01); D07B 2501/2038 (2013.01); D07B 2501/2061 (2013.01); D10B 2321/0211 (2013.01); Y10T 428/1369 (2015.01); Y10T 428/24124 (2015.01); Y10T 428/249921 (2015.04); Y10T 428/298 (2015.01); Y10T 428/31913 (2015.04); Y10T 442/60 (2015.04);
Abstract

The invention relates to a multifilament yarn containing n filaments, wherein the filaments are obtained by spinning an ultra-high molecular weight polyethylene (UHMWPE), said yarn having a tenacity (Ten) as expressed in cN/dtex of Ten(cN/dtex)=f×n×dpf, wherein Ten is at least 39 cN/dtex, n is at least 25, f is a factor of at least 58 and dpf is the dtex per filament.


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