The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2022

Filed:

Jul. 15, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Yuelai Wang, Yamanashi, JP;

Soichi Arita, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1692 (2013.01); B25J 9/1697 (2013.01);
Abstract

A calibration system of a robot includes a data storage unit that stores a number of pieces of data in which actual measured position information obtained by actually measuring a tip position of the robot and information indicating a state of the robot upon actual measurement are combined, a parameter selecting unit that selects mechanical error parameters to be identified from parameters indicating mechanical errors of the robot, a parameter identifying unit that identifies each of the mechanical error parameters using the stored data and information of the selected mechanical error parameters, and an identification result evaluating unit that evaluates an identification result, and, in the case where evaluation does not satisfy a predetermined criterion, selection of different mechanical error parameters by the parameter selecting unit, identification and evaluation are repeated.


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