The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Sep. 17, 2019
Applicant:
Ngk Insulators, Ltd., Nagoya, JP;
Inventors:
Takeshi Hagio, Inazawa, JP;
Kenichi Noda, Nagoya, JP;
Makoto Miyahara, Tajimi, JP;
Katsuya Shimizu, Nagoya, JP;
Aya Miura, Nagoya, JP;
Ryotaro Yoshimura, Kasugai, JP;
Assignee:
NGK Insulators, Ltd., Nagoya, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 71/02 (2006.01); B01D 69/10 (2006.01); C01B 39/46 (2006.01); C01B 39/54 (2006.01); B01D 67/00 (2006.01);
U.S. Cl.
CPC ...
B01D 71/028 (2013.01); B01D 69/10 (2013.01); C01B 39/46 (2013.01); C01B 39/54 (2013.01); B01D 67/0051 (2013.01); C01P 2002/72 (2013.01);
Abstract
A peak intensity of a (002) plane is greater than or equal to 0.5 times a peak intensity of a (100) plane in an X-ray diffraction pattern obtained by irradiation of X-rays to a membrane surface of the ERI membrane.