The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Jul. 01, 2020
Applicant:
Topcon Corporation, Tokyo, JP;
Inventors:
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 3/10 (2006.01); A61B 5/00 (2006.01); G06T 7/32 (2017.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01); G06T 3/00 (2006.01); G06T 3/20 (2006.01); G06T 3/60 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/12 (2013.01); A61B 5/0066 (2013.01); G01B 9/02083 (2013.01); G01B 9/02091 (2013.01); G06T 3/0068 (2013.01); G06T 3/20 (2013.01); G06T 3/60 (2013.01); G06T 7/32 (2017.01); G06T 2200/04 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30041 (2013.01);
Abstract
An OCT imaging method of some exemplary aspects includes acquiring a first three dimensional data set by applying an OCT scan targeting a first three dimensional region of a sample, creating a first two dimensional map based on representative intensity values respectively of a plurality of pieces of A-scan data included in the first three dimensional data set, designating a second three dimensional region of the sample based on the first two dimensional map, acquiring a second three dimensional data set by applying an OCT scan targeting the second three dimensional region, and generating image data from at least part of the second three dimensional data set.