The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Aug. 31, 2018
Applicant:
Commscope Technologies Llc, Hickory, NC (US);
Inventors:
Andrew E. Beck, Ashburn, VA (US);
Meihua Liang-Legrand, Vienna, VA (US);
Navin Srinivasan, Fairfax, VA (US);
Assignee:
CommScope Technologies LLC, Charlotte, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 16/30 (2009.01); H04W 24/08 (2009.01); H04W 52/24 (2009.01); H04B 17/391 (2015.01); H04B 7/06 (2006.01); H04B 17/318 (2015.01); H04B 17/309 (2015.01); H04B 17/336 (2015.01);
U.S. Cl.
CPC ...
H04W 16/30 (2013.01); H04B 7/0617 (2013.01); H04B 17/309 (2015.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01); H04B 17/3913 (2015.01); H04W 24/08 (2013.01); H04W 52/242 (2013.01);
Abstract
In one embodiment, a method is provided. The method comprises determining a free space path loss distance at a frequency of a transmitter; determining a morphology class for a geographic location of the transmitter; determining a scaling factor P corresponding to the determined morphology class; determining a circular analysis region based upon the scaling factor P; and generating a contour.