The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Jan. 31, 2021
Labsphere, Inc., North Sutton, NH (US);
Jeffrey Holt, Concord, NH (US);
David Nicholas Conran, Swarthmore, NH (US);
Other;
Abstract
A method of characterizing an imaging system includes generating a plurality of point spread function ('PSF') samples using the imaging system, each PSF sample representing a response of an imaging system to a point illumination source, each PSF sample comprising one or more pixel values. The method also includes co-registering the pixel values contained in each of the plurality of PSF samples to form an oversampled point spread function ('PSF') population; resampling the oversampled PSF population to uniform spacing to form a PSF image; slicing the PSF image in an evaluation direction to form a slice of the PSF image; and evaluating the slice to determine a value of a resolution metric of the imaging system that is specific to the evaluation direction.