The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Oct. 02, 2019
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Shuchu Han, Princeton Junction, NJ (US);
Wei Cheng, Princeton Junction, NJ (US);
Dongjin Song, Princeton, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Yuncong Chen, Plainsboro, NJ (US);
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 16/2457 (2019.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06F 16/24578 (2019.01); G06F 21/552 (2013.01); G06F 21/554 (2013.01); H04L 63/1416 (2013.01);
Abstract
Methods and systems for detecting and correcting anomalies include ranking sensors in a cyber-physical system according to a degree of influence each sensor has on a measured performance indicator in the cyber-physical system. An anomaly is detected in the cyber-physical system based on the measured performance indicator. A corrective action is performed responsive to the detected anomaly, prioritized according to sensor rank.