The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Sep. 17, 2018
Applicant:

Murata Manufacturing Co., Ltd., Nagaokakyo, JP;

Inventors:

Mari Saji, Nagaokakyo, JP;

Ryo Nakagawa, Nagaokakyo, JP;

Hideki Iwamoto, Nagaokakyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 9/02 (2006.01); H03H 9/25 (2006.01); H03H 9/145 (2006.01);
U.S. Cl.
CPC ...
H03H 9/25 (2013.01); H03H 9/02559 (2013.01); H03H 9/02574 (2013.01); H03H 9/14541 (2013.01);
Abstract

An elastic wave device includes a piezoelectric layer, an IDT electrode on the piezoelectric layer, a high-acoustic-velocity member, a low-acoustic-velocity film between the high-acoustic-velocity member and the piezoelectric layer. The piezoelectric layer is made of lithium tantalate, the IDT electrode includes metal layers including an Al metal layer and a metal layer having a higher density than Al. Expression 1 is satisfied: 301.74667−10.83029×T−3.52155×T+0.10788×T+0.01003×T+0.03989×T×T≥0 expression 1, where λ represents a wavelength defined by an electrode finger pitch of the IDT electrode, T(%) represents a normalized film thickness of the piezoelectric layer to the wavelength λ, and T(%) represents a normalized film thickness of the IDT electrode in terms of Al to the wavelength λ.


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